Delnummer :
SN74BCT8374ANTG4
Produsent :
Texas Instruments
Beskrivelse :
IC SCAN TEST DEVICE W/FF 24-DIP
Logisk type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Forsyningsspenningen :
4.5V ~ 5.5V
Driftstemperatur :
0°C ~ 70°C
Monteringstype :
Through Hole
Pakke / sak :
24-DIP (0.300", 7.62mm)
Leverandørenhetspakke :
24-PDIP