Delnummer :
SN74ABT18652PM
Produsent :
Texas Instruments
Beskrivelse :
IC SCAN-TEST-DEV/TXRX 64-LQFP
Logisk type :
Scan Test Device With Transceivers And Registers
Forsyningsspenningen :
4.5V ~ 5.5V
Driftstemperatur :
-40°C ~ 85°C
Monteringstype :
Surface Mount
Leverandørenhetspakke :
64-LQFP (10x10)