Delnummer :
SN74LVTH182512DGGR
Produsent :
Texas Instruments
Beskrivelse :
IC SCAN-TEST-DEV/XCVR 64-TSSOP
Logisk type :
ABT Scan Test Device With Universal Bus Transceivers
Forsyningsspenningen :
2.7V ~ 3.6V
Driftstemperatur :
-40°C ~ 85°C
Monteringstype :
Surface Mount
Pakke / sak :
64-TFSOP (0.240", 6.10mm Width)
Leverandørenhetspakke :
64-TSSOP