Delnummer :
SN74BCT8374ADWRE4
Produsent :
Texas Instruments
Beskrivelse :
IC SCAN TEST DEVICE W/FF 24-SOIC
Logisk type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Forsyningsspenningen :
4.5V ~ 5.5V
Driftstemperatur :
0°C ~ 70°C
Monteringstype :
Surface Mount
Pakke / sak :
24-SOIC (0.295", 7.50mm Width)
Leverandørenhetspakke :
24-SOIC