Delnummer :
SN74BCT8244ANT
Produsent :
Texas Instruments
Beskrivelse :
IC SCAN TEST DEVICE BUFF 24-DIP
Logisk type :
Scan Test Device with Buffers
Forsyningsspenningen :
4.5V ~ 5.5V
Driftstemperatur :
0°C ~ 70°C
Monteringstype :
Through Hole
Pakke / sak :
24-DIP (0.300", 7.62mm)
Leverandørenhetspakke :
24-PDIP